Profilometer PCE-RT 2200
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Storage of up to 20 measurement processes / extensive number of parameters / micro-USB interface for charging the battery and reading out the memory
Description
Storage of up to 20 measurement processes / extensive number of parameters / micro-USB interface for charging the battery and reading out the memory
The portable and easy-to-use profilometer with its large OLED display is particularly suitable for quick and precise measurements in the workshop or laboratory. This roughness meter uses a DSP chip for control and data processing at high speed and with low energy consumption. In addition, you have a large selection of measurement parameters for the roughness measuring device: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME ), Rv (ASME), R3z, R3zmax, Rz1max, Rmr (c), Rdc, Rmr.
The measurements are automatically stored in the internal memory of the roughness meter. The stored data can then be transferred to a PC via the micro-USB interface on the roughness measuring device and analyzed using the software. It is also possible to have the data displayed on the OLED display of the roughness measuring device after a measurement. Even the wave course can be shown on the display of the roughness meter.
It often happens that the contact surface of the test piece is too small for a roughness measuring device to position the roughness measuring device appropriately for a measurement. For such cases, a positioning adapter is included with this roughness measuring device. Thus, the roughness measuring device also enables measurements on small samples.
– Selection of 21 parameters
– Large graphic OLED display
– Fast and accurate measurement
– 3 different cut-off wavelengths
– Micro-USB interface for PC connection
– Storage of 20 measurement curves
Specification
| Parameter | Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry(JIS), |
| Rz(JIS), RP(ASME), Rpm(ASME), Rv(ASME), | |
| R3z, R3zmax, Rz1max, Rmr(c), Rdc, Rmr | |
| Measuring range | Ra, Rq, Rc: 0.005 … 16 µm |
| Rsm: 5 … 1000 µm | |
| Rsk: -1 … 1 | |
| Rz, Rt, Rp, Rv, Rmax, Ry(JIS), Rz(JIS),RP(ASME), | |
| Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max, | |
| Rdc: 0.02 … 200 µm Rmr(c), Rmr: 0 … 100 % | |
| Probe tip radius | 5 µm |
| Probe tip material | diamond, 90° angled |
| Max.recommended force | 4 mN (0.4 gf) |
| with static measurement | |
| Measuring principle | inductive |
| Radius of the longitudinal guide rail | 45 mm |
| Standards | ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287) |
| Maximum travel distance | 15 mm |
| Cut off wavelength | 0.25 mm / 0.8 mm / 2.5 mm |
| Scanning speed | 0.135 mm/s at cutoff wavelength: 0.25 mm |
| 0.5 mm/s at cutoff wavelength: 0.8 mm | |
| 1 mm/s at cut-off wavelength: 2.5 mm | |
| Return speed: 1 mm/s | |
| Memory | 20 measurement runs with all parameters |
| Measurement accuracy | <±10 % |
| Repeatability | <6 % |
| Display | OLED |
| Units | μm / μinch (switchable) |
| Interface | Micro USB |
| Power supply | rechargeable Li-ion battery |
Delivery Scope
1 x Micro probe
1 x Protective cap for probe
1 x Positioning device
1 x Calibration plate
1 x Roughness standard
1 x USB cable
1 x Charging adapter
1 x Carrying case
1 x Instruction manual
